Description
Technical Data
|
|
p-type |
n-type |
|
Dislocation density (EPD, cm2) |
≤ 10 000 |
≤ 5 000 |
|
Lineage (unit length = slice radius) |
≤ 4 |
≤ 3 |
|
Mosaic structures (unit surface = 10 mm2) |
≤ 6 |
≤ 3 |
|
Saucers (cm2) |
≤ 500 |
≤ 500 |
Description
The crystals are Czochralski grown in the (100) crystallographic direction. The outer crystal surface is as grown or cylindrically ground (surface roughness max 2,5 μm RMS). The crystal soundness is checked by infrared thermography.
- Transport properties - Hall mobility μH
- p-type μH ≥ 10 000 cm2/V.s (Center measurement)
- n-type μH ≥ 10 000 cm2/V.s (Center measurement)
- Deep levels (measured by DLTS)
- p-type : Cutot ≤ 4,5 109 cm-3
- n-type : Deep level point defects < 5 108 cm-3
- Crystallographic perfection:
Data Sheet